Comparator circuit for semiconductor test system

Details Comparator circuit for semiconductor test system Comparator circuit for semiconductor test system

2005-02-15

2005-02-15

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C327S065000

Reexamination Certificate

active

06856158

ABSTRACT:
A comparator circuit for use in a semiconductor test system for comparing differential output signals of a semiconductor device under test (DUT). The comparator circuit is formed of a first pair of comparators having a DC comparator and an AC comparator which receives a first differential signal, a second pair of comparators having a DC comparator and an AC comparator which receives a second differential signal, a first latch for latching output of the first pair of comparators, a second latch for latching output of the second pair of comparators, and first and second serial-parallel converters for converting output signals of the first and second latches into parallel signals. The comparator circuit is formed of discrete components on a dielectric substrate.

REFERENCES:
patent: 5898326 (1999-04-01), Okayasu
patent: 6016566 (2000-01-01), Yoshida
patent: 6300804 (2001-10-01), Vadipour
patent: 6323694 (2001-11-01), Creek
patent: 6392448 (2002-05-01), Vadipour
Oshima et al, Pin Electronics IC for High Speed Differential Devices, ITC International Test Conference, pp. 1128-1133, (month unavailable) 2001.

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