Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-15
2005-02-15
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C327S065000
Reexamination Certificate
active
06856158
ABSTRACT:
A comparator circuit for use in a semiconductor test system for comparing differential output signals of a semiconductor device under test (DUT). The comparator circuit is formed of a first pair of comparators having a DC comparator and an AC comparator which receives a first differential signal, a second pair of comparators having a DC comparator and an AC comparator which receives a second differential signal, a first latch for latching output of the first pair of comparators, a second latch for latching output of the second pair of comparators, and first and second serial-parallel converters for converting output signals of the first and second latches into parallel signals. The comparator circuit is formed of discrete components on a dielectric substrate.
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Oshima et al, Pin Electronics IC for High Speed Differential Devices, ITC International Test Conference, pp. 1128-1133, (month unavailable) 2001.
Chrusciel Richard W.
Frame James W.
Advantest Corp.
Karlsen Ernest
Muramatsu & Associates
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