Compact, variable length interferometer delay stage

Details Compact, variable length interferometer delay stage Compact, variable length interferometer delay stage

1998-11-17

2000-10-31

Kim, Robert H.

Optics: measuring and testing

By particle light scattering

With photocell detection

356356, 356358, G01B 902

Patent

active

061410993

ABSTRACT:
A compact delay stage for phase delaying a light signal to provide increased amounts of phase delay to a light signal. A plurality of reflective structures are configured to provide a delay path to the light signal. One of the reflective structures is configured to accept the light signal and direct the light signal between the reflective structures a predetermined selectable number of times until the light signal has completed the delay path thereby translating the light signal into a delay signal. One of the reflective structures is configured to provide egress to the delayed signal to exit the compact delay stage.

REFERENCES:
patent: 5825493 (1998-10-01), McGlynn

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