Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1998-10-19
2000-06-27
Hantis, K. P.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
333 94PL, G01J 330, H01P 100, G01N 2169
Patent
active
060813296
ABSTRACT:
A method and portable apparatus for self-powered, sensitive analysis of solid, liquid or gas samples for the presence of elements is provided. The apparatus includes a compact sensor system which utilizes a microwave power source and a shorted waveguide to induce a plasma. The microwave power source may be a magnetron or the like. The device includes a portable power supply and preferably includes a portable battery charger. The portable power supply includes a compact generator-internal combustion engine unit. The device can be operated by directly using power from the portable power supply or in a more compact embodiment by using power from batteries that are recharged by a separate portable power supply module. Pulsed microwave operation can be used to reduce average power requirements and facilitate the use of very compact units using batteries. The device is capable of being transported to and from remote sites for analysis by an individual without the need for heavy transportation equipment. A computer may be utilized to control the portable power supply, the battery charger and the microwave power source. The method and apparatus are capable of analyzing samples for the presence of several elements simultaneously using fiber optic guides and a spectrometer system. The apparatus can be contained in a plurality of readily detactable modules to facilitate transportation and field operation.
REFERENCES:
patent: 3554648 (1971-01-01), Boostrom et al.
patent: 3612686 (1971-10-01), Braman
patent: 3665182 (1972-05-01), Goff et al.
patent: 4154000 (1979-05-01), Kramer
patent: 4341723 (1982-07-01), Hirosawa
patent: 4888295 (1989-12-01), Zaromb et al.
patent: 4933650 (1990-06-01), Okamoto
patent: 4965540 (1990-10-01), Sullivan
patent: 5014287 (1991-05-01), Thornton et al.
patent: 5141059 (1992-08-01), Marsh
patent: 5211142 (1993-05-01), Matthews et al.
patent: 5262610 (1993-11-01), Huang et al.
patent: 5270616 (1993-12-01), Itatani
patent: 5319437 (1994-06-01), Van Aken et al.
patent: 5376245 (1994-12-01), McLeod
patent: 5428222 (1995-06-01), Alexay
patent: 5479254 (1995-12-01), Woskov et al.
patent: 5889587 (1999-03-01), D'Silva et al.
Bacharach Instrument Co. (Pittsburg, PA), Produce description for "J-W Mercury Vapor Sniffer", No date.
Barnes et al., "Design Concepts for Strip-Line Microwave Spectrochemical Sources", Anal. Chem., vol. 62, No. 23, pp. 2650-2654 (Dec. 1, 1990).
Beenakker et al., "An Assessment of a Microwave-Induced Plasma Generated in Argon with a Cylindrical TM.sub.010 Cavity as an Excitation Source for Emission Spectrometric Analysis of Solutions", Spectrochimica Acta, vol. 33, pp. 373-381 (1978).
Blades et al., "Application of Weakly Ionized Plasmas for Materials Sampling and Analysis", IEEE Transactions on Plasma Science, vol. 19, No. 6, pp. 1090-1113 (1991).
Demirgian, "Continuous Emission Monitor For Incinerators", U.S. Depart. of Energy Info. Exchange Meeting on the Characterization, Monitoring and Sensor Technologies, Dallas, Texas (Jun. 3-4, 1992).
Fehsenfeld, "Microwave Discharge Cavities Operating at 2450 MHz", the Review of Scientific Instruments, vol. 36, No. 3 Mar. 1968, pp. 294-298.
Forbes et al., "Comparison of Microwave-Induced Plasma Sources", J. of Analytical Atomic Spectrometry, vol. 6, pp. 57-71 (1991).
Goode et al., "A Review of Instrumentation Used to Generate Microwave-Induced Plasmas", Applied Spectroscopy, vol. 38, No. 6, pp. 755-763 (Nov./Dec. 1984).
Ishizuka et al., "Atomic Emission Spectrometry of Solid Samples with Laser Vaporization-Microwave Induced Plasma System", Anal. Chem., vol. 52, pp. 125-129 (1980).
Matousek et al., "Microwave-Induced Plasmas: Implementation and Application", Prog. Analyt. Atom. Spectrosc., vol. 7, pp. 275-314 (1984).
Matusiewicz, "A Novel Microwave Plasma Cavity Assembly for Atomic Emission Spectrometry", Spectrchimica Acta., vol. 47B, No. 10, pp. 1221-1227 (1992).
Okamoto et al., "High-Power Microwave-Induced Plasma Source for Trace Element Analysis", Japanese Journal of Applied Physics, vol. 29, No. 4, pp. L670-L672 (Apr. 1990).
Okamoto, "Annular-Shaped Microwave-Induced Nitrogen plasma at Atmospheric Pressure for Emission Spectrometry of Solutions", Analytical Sciences, vol. 7, pp. 283-288 (1991).
Pacific Northwest Laboratory, Technology Brief for "Spectrochemical Emission Sensor", (No Date).
Skogerboe et al., "Microwave Plasma Emission Spectrometry", Analytical Chemistry, vol. 48, No. 7 (Jun. 1976).
Smith et al., "Microwave Atmospheric Pressure Plasma Torch, Characteristics and Application", 27th Microwave Symposium, Washington, D.C. (Aug. 2-5, 1992).
Taylor et al., "Determination of Trace Impurities in Argon By Microwave Induced Excitation", Analytical Chemistry, vol. 42, No. 8, pp. 876-881 (Jul. 1970).
Woskov et al., "New Temperature and Metals Emisions Monitoring Technologies for Furnaces", to be published in the Proceedings of the International Symposium on Environmental Technologies: Plasma Systems and Applications, Atlanta, Georgia (Oct. 8-11, 1995).
Zander et al., "Microwave-Supported Discharges", Applied Spectroscopy, vol. 35, No. 4, pp. 357-371 (1981).
Zander, "Atomic Emission Sources for Solution Spectrochemistry", Analytical Chemistry, vol. 58, No. 11 (Sep. 1986).
Cohn Daniel R.
Surma Jeffrey E.
Titus Charles H.
Woskov Paul
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