Optics: measuring and testing – Lamp beam direction or pattern
Patent
1998-02-04
2000-05-02
Kim, Robert H.
Optics: measuring and testing
Lamp beam direction or pattern
356354, 250201, G01J 120
Patent
active
060579137
ABSTRACT:
A compact wavefront sensor includes an array of microlenses supported above a microchip. The microchip includes an array of gratings and photodetectors, which correspond to a particular microlens. Light incident on a grating will be diffracted back towards the array of microlenses, where it is focussed onto a corresponding photodetector. The photodetector receives light from gratings adjacent thereto, and detects a resulting interference therebetween. The detected interference is then used to reconstruct the wavefront. The detected interference can also be used to correct wavefronts by controlling a modulating element reflecting the wavefront.
Brown Dan
Clark Rodney L.
Lindsey Randall
Kim Robert H.
Lee Andrew H.
Mems Optical Inc.
LandOfFree
Compact shearing wavefront sensor and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Compact shearing wavefront sensor and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact shearing wavefront sensor and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1598080