Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1988-05-23
1989-07-25
Willis, Davis L.
Optics: measuring and testing
Material strain analysis
By light interference detector
356354, G01B 902
Patent
active
048506931
ABSTRACT:
A compact and portable moire interferometer used to determine surface deformations of an object. The improved interferometer is comprised of a laser beam, optical and fiber optics devices coupling the beam to one or more evanescent wave splitters, and collimating lenses directing the split beam at one or more specimen gratings. Observation means including film and video cameras may be used to view and record the resultant fringe patterns.
REFERENCES:
patent: 4432239 (1984-02-01), Bykov
patent: 4459027 (1984-07-01), Kafri et al.
patent: 4474466 (1984-10-01), McDonach et al.
patent: 4577940 (1986-03-01), Krasinski et al.
patent: 4641972 (1987-10-01), Halioua et al.
McDonach et al; Optics and Lasers in Engineering, vol. 1, No. 2, pp. 85-105, 12/80.
McKelvie et al; Proc. SPIE, vol. 814, pp. 464-474, 1987.
Deason Vance A.
Ward Michael B.
Albrecht John M.
Cordell Helen S.
Hightower Judson R.
Koren Matthew W.
The United States of America as represented by the United States
LandOfFree
Compact portable diffraction moire interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Compact portable diffraction moire interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact portable diffraction moire interferometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2352924