Compact interferometric test system for ellipses

Details Compact interferometric test system for ellipses Compact interferometric test system for ellipses

1998-08-11

1999-07-27

Kim, Robert H.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356358, G01B 902

Patent

active

059299924

ABSTRACT:
A method and apparatus for testing elliptical mirrors is provided which reduces the length of the test apparatus by half, provides for precise location of the focus of the interferometer beam, and precise measurement of the distance between foci of the elliptical mirror under test. A small reflective sphere (10) with an optical passageway (15) through its center is used to locate the focal point (f.sub.2) of the interferometer (5) within interferometric precision. A plane mirror (30) is placed half way between the focal points of the ellipse (20) under test with one of the elliptical foci coincident with the interferometer focal point (f.sub.2). The elliptical mirror (20) under test is placed with reflective concave surface facing away from the interferometer (5) to receive light reflected from the plane mirror (30). The optical passageway (15) is sized to emit a volume of light to fill the elliptical mirror surface (22) after reflection from the plane mirror (30). The optical passageway (15) is also sized for the sphere (10) to reflect substantially all of the light incident upon it from the ellipse (20).

REFERENCES:
patent: 5155554 (1992-10-01), Schnable et al.
patent: 5283629 (1994-02-01), Day et al.
patent: 5625454 (1997-04-01), Huang et al.

Affiliated with

Also associated with

Rating

Compact interferometric test system for ellipses does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Compact interferometric test system for ellipses, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact interferometric test system for ellipses will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-885381