Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate
2006-04-25
2006-04-25
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Having polarization
C356S494000, C356S495000
Reexamination Certificate
active
07034947
ABSTRACT:
Interference measuring apparatus for detecting a plurality of different interference phase signals. The apparatus has a light dividing member for dividing linearly polarized light beams superposed one upon another into a plurality of light beams. The apparatus also includes a light transmitting member with a plurality of light passing portions having different light transmitting properties in conformity with the incidence positions of the plurality of light beams divided by the light dividing member. In addition, the apparatus has a polarizing plate to receive the plurality of light beams that passed through the light transmitting member.
REFERENCES:
patent: 3316799 (1967-05-01), Daley et al.
patent: 3822942 (1974-07-01), Hock
patent: 5000572 (1991-03-01), Nose et al.
patent: 5283434 (1994-02-01), Ishizuka et al.
patent: 5333048 (1994-07-01), Michel et al.
patent: 5390022 (1995-02-01), Ishizuka et al.
patent: 5392116 (1995-02-01), Makosch
patent: 5424535 (1995-06-01), Albion et al.
patent: 5448358 (1995-09-01), Ishizuka et al.
patent: 5481106 (1996-01-01), Nyui et al.
patent: 5483332 (1996-01-01), Takamiya et al.
patent: 5483377 (1996-01-01), Kaneda et al.
patent: 5498870 (1996-03-01), Ishizuka
patent: 5502466 (1996-03-01), Kato et al.
patent: 5557396 (1996-09-01), Ishizuka et al.
patent: 5569913 (1996-10-01), Ishizuka et al.
patent: 5621527 (1997-04-01), Kaneda et al.
patent: 5629793 (1997-05-01), Takamiya et al.
patent: 5640239 (1997-06-01), Takamiya et al.
patent: 5663794 (1997-09-01), Ishizuka
patent: 5666196 (1997-09-01), Ishii et al.
patent: 5680211 (1997-10-01), Kaneda et al.
patent: 5717488 (1998-02-01), Watanabe
patent: 5737070 (1998-04-01), Kato
patent: 5737116 (1998-04-01), Kadowaki et al.
patent: 5742577 (1998-04-01), Horimai et al.
patent: 5754282 (1998-05-01), Kato et al.
patent: 5774218 (1998-06-01), Takamiya et al.
patent: 5796470 (1998-08-01), Ueda et al.
patent: 5815267 (1998-09-01), Kato et al.
patent: 5880839 (1999-03-01), Ishizuka et al.
patent: 5926276 (1999-07-01), Takamiya et al.
patent: 5956140 (1999-09-01), Ishizuka et al.
patent: 6075235 (2000-06-01), Chun
patent: 6151185 (2000-11-01), Ishizuka et al.
patent: 6229140 (2001-05-01), Ishizuka
patent: 6493170 (2002-12-01), Kato et al.
patent: 0 525 446 (1993-02-01), None
patent: 0 903 559 (1999-03-01), None
Horyu Sakae
Ishizuka Ko
Kadoshima Takayuki
Kadowaki Hidejiro
Kaneda Yasushi
Canon Kabushiki Kaisha
Turner Samuel A.
LandOfFree
Compact interference measuring apparatus for detecting the... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Compact interference measuring apparatus for detecting the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact interference measuring apparatus for detecting the... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3571441