Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2008-03-20
2009-10-27
Evans, F. L (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
07609381
ABSTRACT:
A spectrometer apparatus includes a refractor element, a slit, a detector, a diffraction grating, and a corrector lens. The refractor element includes a rear surface and a front surface. The slit provides an optical path to the rear surface of the refractor element, and is configured to transmit an image incident thereupon along the optical path. The detector is positioned facing the rear surface of the refractor element. The diffraction grating faces the front surface of the refractor element, and is configured to spectrally disperse and reimage the image of the slit toward the front surface of the refractor element. The corrector lens is positioned between the refractor element and the diffraction grating such that the image is provided to the detector corrected for a spherical aberration caused by a separation distance between the detector and the rear surface of the refractor element.
REFERENCES:
patent: 5303001 (1994-04-01), Jeong et al.
patent: 5757493 (1998-05-01), VanKerkhove
patent: 5995221 (1999-11-01), Slutter et al.
patent: 6088134 (2000-07-01), Schmidt
patent: 6181418 (2001-01-01), Palumbo et al.
patent: 6288781 (2001-09-01), Lobb
patent: 6538736 (2003-03-01), Palumbo
patent: 6636350 (2003-10-01), Shafer et al.
patent: 6813098 (2004-11-01), Mercado
patent: 6844972 (2005-01-01), McGuire, Jr.
patent: 6863403 (2005-03-01), Mercado et al.
patent: 6879383 (2005-04-01), Mercado
patent: 6970232 (2005-11-01), McGuire, Jr.
patent: 6995908 (2006-02-01), McGuire
patent: 2002/0171815 (2002-11-01), Matsuyama et al.
patent: 2002/0195548 (2002-12-01), Dowski, Jr. et al.
patent: 2003/0173502 (2003-09-01), Dowski, Jr. et al.
patent: 2004/0027653 (2004-02-01), Shafer et al.
patent: 2005/0248856 (2005-11-01), Omura et al.
L. Mertz, “Concentric spectrographs,” Appl. Opt. 16, 3122-3124 (1977).
D. R. Lobb, “Theory of concentric designs for grating spectrometers,” Appl. Opt. 33, 2648-2658 (1994).
D. R. Lobb, “Imaging spectrometers using concentric optics,” Proc. SPIE 3118, 339-347 (1997).
P, Mouroulis, D. W. Wilson, P. D. Maker, and R. E. Muller, “Convex Grating Types for Concentric Imaging Spectrometers,” Appl. Opt. 37, Issue 31, pp. 7200-7208, Nov. 1, 1998.
P. Mouroulis and R. O. Green, “Optical design for imaging spectroscopy,” Proc. SPIE 5173, 18-25 (2003).
Evans F. L
Henricks Slavin & Holmes LLP
The Aerospace Corporation
LandOfFree
Compact, high-throughput spectrometer apparatus for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Compact, high-throughput spectrometer apparatus for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Compact, high-throughput spectrometer apparatus for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4123592