Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-11-21
2000-07-11
Brown, Glenn W.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324663, 324686, 324694, 324722, 324 711, 73 5303, 73 73, G01N 2702, G01N 2712, G01N 3334
Patent
active
060878371
ABSTRACT:
A measurement apparatus for sensing three properties of materials including a fixed impedance element coupled in series with the sensor array between an input signal and a reference potential (e.g. ground). The sensor array of the apparatus is an electrode configuration which includes a first elongated electrode coupled to the reference potential and second and third segmented elongated electrodes being parallel to and essentially in the same plane as the first elongated electrode. The segments within the second and third electrodes are configured such that the segments in the second electrode are staggered with respect to segments in the third electrode thereby minimizing or eliminating spacing between detection cells within the sensor array, reducing overall size of the sensor array and increasing measurement resolution. The sensor array exhibits a variable impedance resulting from changes in physical characteristics of the material. The variable impedance of the sensor array relates to changes in property of the material being sensed which can then be related to changes in other physical characteristics of the material such as weight, chemical composition, and temperature. The reduced size and increased resolution of the sensor array is particularly adaptive to a twin mesh sheetmaking system.
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Brown Glenn W.
Honeywell-Measurex
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