Optics: measuring and testing – By light interference – Having wavefront division
Reexamination Certificate
2008-07-17
2010-11-02
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
Having wavefront division
Reexamination Certificate
active
07826066
ABSTRACT:
A method and a system for analyzing the wavefront of a light beam, wherein a diffraction grating is arranged in a plane perpendicular to the light beam to be analyzed and optically conjugated to the analysis plane. Different emerging beams of the grating interfere to generate an image having deformations linked to the gradients of the wavefront to be analyzed.The method is characterized in that the grating carries out the multiplication of an intensity function which is implemented by a two-dimensional grating with hexagonal meshing of surface S transmitting the light of the beam to be analyzed into plural emerging beams arranged in a hexagonal meshing, by an phase function which is implemented by a two-dimensional grating with hexagonal meshing of surface3S which introduces a phase shift close to 2π/3 (modulo 2π) between two adjacent secondary beams.
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“Wavefront Sensor Prototype for Industrial Applications Based on a Three-Level Phase Grating”, by Jerome Primot et al, Optics Engineering, Mar. 1997, pp. 901-904.
Guerineau Nicolas
Primot Jerome
Velghe Sabrina
Chowdhury Tarifur
Cook Jonathon D.
Laubscher, Jr. Lawrence E.
Laubscher, Sr. Lawrence E.
ONERA (Office National d'Etudes et de Recherches Aerospatiales)
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