Communication interface for virtual IC tester

Details Communication interface for virtual IC tester Communication interface for virtual IC tester

2005-04-12

2005-04-12

Assouad, Patrick J. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

C703S019000, C714S741000, C714S744000, C714S731000, C716S030000

Reexamination Certificate

active

06879927

ABSTRACT:
A method of verifying test data for testing an integrated circuit device having multiple device time domains includes selecting a virtual tester time domain and, if the cycle duration of the virtual tester time domain is equal to the cycle duration of one of the multiple device time domains, translating the test data for each device time domain other than that one time domain to the virtual tester time domain and otherwise translating the test data for each device time domain to the virtual tester time domain. The translated test data is then applied to a device logic simulator that simulates integrated circuit device.

REFERENCES:
patent: 5867695 (1999-02-01), Amini et al.
patent: 6557128 (2003-04-01), Turnquist
patent: 6557133 (2003-04-01), Gomes
patent: 6651205 (2003-11-01), Takahashi
patent: 6678643 (2004-01-01), Turnquist et al.
patent: 6715093 (2004-03-01), Farmer et al.
patent: 20020184560 (2002-12-01), Wang et al.
patent: 20040158760 (2004-08-01), Farmer et al.
Sehgal et al., “SOC Test Planning Using Virtual Test Access Architectures”, IEEE, 2004.*
Schmid et al., “Advanced Synchronous Scan Test Methodology for Multi Clock Domain ASICs”, IEEE, unknown date.*
Ashkinazy et al., “Tools for Validating Asynchronous Digital Circuits”, IEEE, 1994.

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