Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-01-08
1999-10-26
Kim, Robert
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356360, G01B 902
Patent
active
059737840
ABSTRACT:
Common path, two beam interferometers and interferometric measurement systems employ a voltage controlled variable phase retarder enabling rapid stepping of the relative phase between two interfering optical beams by suitable control of the voltage. The beams need not be laterally separated. A compact beam expander with a ball lens is preferably included. The system is compact enough to be contained in a hand-held unit. The system can be used for surface mapping, testing of optical components and detecting the motion of mechanical objects, for example. It is particularly well suited for the mapping of the skin of a live subject. An optimum fringe period and optimum illumination wavelengths for imaging skin are disclosed, enabling the topography of substantial areas of human skin to be rapidly and accurately measured, in times on the order of one-tenth of a second. Methods of conducting interferometric analysis are disclosed, as well.
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Greenebaum Michael
Shultz Theodore S.
Szwaykowski Piotr
Electro-Optical Sciences Inc.
Kim Robert
LandOfFree
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