Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2006-07-10
2008-09-16
Connolly, Patrick (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
C356S497000
Reexamination Certificate
active
07426036
ABSTRACT:
Common path frequency domain optical coherence reflectometry/tomography devices with an additional interferometer are suggested. The additional interferometer offset is adjusted such, that it is ether less than the reference offset, or exceeds the distance from the reference reflector to the distal boundary of the longitudinal range of interest. This adjustment allows for relieving the requirements to the spectral resolution of the frequency domain optical coherence reflectometry/tomography engine and/or speed of the data acquisition and processing system, and eliminates depth ambiguity problems. The new topology allows for including a phase or frequency modulator in an arm of the additional interferometer improving the signal-to-noise ratio of the devices. The modulator is also capable of substantially eliminating mirror ambiguity, DC artifacts, and autocorrelation artifacts. The interference signal is produced either in the interferometer or inside of the optical fiber probe leading to the sample.
REFERENCES:
patent: 5268741 (1993-12-01), Chou et al.
patent: 5956355 (1999-09-01), Swanson et al.
patent: 6053613 (2000-04-01), Wei et al.
patent: 6160826 (2000-12-01), Swanson et al.
patent: 6501551 (2002-12-01), Tearney et al.
patent: 6552797 (2003-04-01), Swanson
patent: 6687010 (2004-02-01), Horii et al.
patent: 6738144 (2004-05-01), Dogariu
patent: 7280221 (2007-10-01), Wei
patent: 2003/0103212 (2003-06-01), Westphal et al.
patent: 2004/0239938 (2004-12-01), Izatt
patent: 2004/0239943 (2004-12-01), Izatt et al.
patent: 2005/0140982 (2005-06-01), Chen et al.
Kobayashi et al., “Optical Fiber Component Characterization by Hygh-Intensity and High-Spatial-Resolution Interferometric Optical-Time—Domain Reflectometer,” Jun. 1991, IEEE Photonics Technology Letters, vol. 3, No. 6, pp. 564-566.
Kobayashi et al., “Polarization-Independent Interferometric Optical-Time—Domain Reflectometer,” May 1991, J. of Lightwave Tech., vol. 9, No. 5, pp. 623-628.
Kobayashi et al., “High-spatial-resolution and high-sensitivity interferometric optical-time-domain reflectometer,” 1991, SPIE, vol. 1474, pp. 278-284.
Takada et al., “Rayleigh backscattering measurement of single-mode fibers by low coherence optical time-domain reflectometer with 14 micron spatial resolution,” Jul. 8, 1991, Appl. Phys. Lett, 59 (2), pp. 143-145.
Ozeki et al., “Polarization-mode dispersion measurement by an optical time-domain reflectometer with polarimetry assuming backscattering by randomly oriented nonspherical particles,” Aug. 1, 2003, Optics Letters, vol. 28, No. 15, pp. 1293-1295.
Feldchtein Felix I.
Gelikonov Grigory V.
Connolly Patrick
Imalux Corporation
Renner , Otto, Boisselle & Sklar, LLP
Richey Scott M
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