Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1985-09-03
1986-12-09
LaRoche, Eugene R.
Optics: measuring and testing
By particle light scattering
With photocell detection
356345, 356358, G01B 902
Patent
active
046277315
ABSTRACT:
A common optical path interferometric gauge comprises an optical beam that is split into two beams. Both beams are modulated and recombined after introducing an optical path length difference greater than the coherence length of the optical source. The combined beam is guided along a common optical path and is subsequently split into reference and measurement beams. The measurement beam is guided along a measurement optical path that includes a moving workpiece surface. Both beams are recombined after interposing an optical path length difference therebetween so as to reestablish coherence between portions thereof, producing optical interference indicative of the surface movement.
REFERENCES:
patent: 3812496 (1974-05-01), Brooks
patent: 3877813 (1975-04-01), Hayes et al.
patent: 4013366 (1977-03-01), Philbert
patent: 4368981 (1983-01-01), Ozeki
Fernald Mark R.
Waters James P.
Grogan J. Kevin
LaRoche Eugene R.
Mottola Steven J.
United Technologies Corporation
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