Image analysis – Image compression or coding
Reexamination Certificate
2005-03-29
2005-03-29
Miriam, Daniel (Department: 2621)
Image analysis
Image compression or coding
C382S255000, C382S276000, C382S283000, C250S201200, C359S016000
Reexamination Certificate
active
06873733
ABSTRACT:
The present invention provides extended depth of field or focus to conventional Amplitude Contrast imaging systems. This is accomplished by including a Wavefront Coding mask in the system to apply phase variations to the wavefront transmitted by the Phase Object being imaged. The phase variations induced by the Wavefront Coding mask code the wavefront and cause the optical transfer function to remain essentially constant within some range away from the in-focus position. This provides a coded image at the detector. Post processing decodes this coded image, resulting in an in-focus image over an increased depth of field.
REFERENCES:
patent: 2959105 (1960-11-01), Sayanagi
patent: 3054898 (1962-09-01), Westover et al.
patent: 3305294 (1967-02-01), Alvarez
patent: 3583790 (1971-06-01), Baker
patent: 3614310 (1971-10-01), Korpel
patent: 3856400 (1974-12-01), Hartmann et al.
patent: 3873958 (1975-03-01), Whitehouse
patent: 4062619 (1977-12-01), Hoffman
patent: 4082431 (1978-04-01), Ward, III
patent: 4174885 (1979-11-01), Joseph et al.
patent: 4178090 (1979-12-01), Marks et al.
patent: 4255014 (1981-03-01), Ellis
patent: 4275454 (1981-06-01), Klooster, Jr.
patent: 4276620 (1981-06-01), Kahn et al.
patent: 4308521 (1981-12-01), Casasent et al.
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4466067 (1984-08-01), Fontana
patent: 4480896 (1984-11-01), Kubo et al.
patent: 4573191 (1986-02-01), Kidode et al.
patent: 4575193 (1986-03-01), Greivenkamp, Jr.
patent: 4580882 (1986-04-01), Nuchman et al.
patent: 4589770 (1986-05-01), Jones et al.
patent: 4642112 (1987-02-01), Freeman
patent: 4650292 (1987-03-01), Baker et al.
patent: 4655565 (1987-04-01), Freeman
patent: 4725881 (1988-02-01), Buchwald
patent: 4734702 (1988-03-01), Kaplan
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
patent: 4804249 (1989-02-01), Reynolds et al.
patent: 4825263 (1989-04-01), Desjardins et al.
patent: 4827125 (1989-05-01), Goldstein
patent: 4843631 (1989-06-01), Steinpichler et al.
patent: 4936661 (1990-06-01), Betensky et al.
patent: 4964707 (1990-10-01), Hayashi
patent: 4989959 (1991-02-01), Plummer
patent: 5003166 (1991-03-01), Girod
patent: 5076687 (1991-12-01), Adelson
patent: 5102223 (1992-04-01), Uesugi et al.
patent: 5128874 (1992-07-01), Bhanu et al.
patent: 5142413 (1992-08-01), Kelly
patent: 5165063 (1992-11-01), Strater et al.
patent: 5166818 (1992-11-01), Chase et al.
patent: 5193124 (1993-03-01), Subbarao
patent: 5218471 (1993-06-01), Swanson et al.
patent: 5243351 (1993-09-01), Rafanelli et al.
patent: 5248876 (1993-09-01), Kerstens et al.
patent: 5260727 (1993-11-01), Oksman et al.
patent: 5270825 (1993-12-01), Takasugi et al.
patent: 5270861 (1993-12-01), Estelle
patent: 5270867 (1993-12-01), Estelle
patent: 5280388 (1994-01-01), Okayama
patent: 5299275 (1994-03-01), Jackson et al.
patent: 5301241 (1994-04-01), Kirk
patent: 5307175 (1994-04-01), Seachman
patent: 5317394 (1994-05-01), Hale et al.
patent: 5337181 (1994-08-01), Kelly
patent: 5426521 (1995-06-01), Chen et al.
patent: 5438366 (1995-08-01), Jackson et al.
patent: 5442394 (1995-08-01), Lee
patent: 5444574 (1995-08-01), Ono et al.
patent: 5465147 (1995-11-01), Swanson
patent: 5473473 (1995-12-01), Estelle et al.
patent: 5476515 (1995-12-01), Kelman et al.
patent: 5521695 (1996-05-01), Cathey, Jr. et al.
patent: 5532742 (1996-07-01), Kusaka et al.
patent: 5555129 (1996-09-01), Konno et al.
patent: 5565668 (1996-10-01), Reddersen et al.
patent: 5568197 (1996-10-01), Hamano
patent: 5572359 (1996-11-01), Otaki et al.
patent: 5610684 (1997-03-01), Shiraishi
patent: 5640206 (1997-06-01), Kinoshita et al.
patent: 5706139 (1998-01-01), Kelly
patent: 5748371 (1998-05-01), Cathey et al.
patent: 5751475 (1998-05-01), Ishiwata et al.
patent: 5756981 (1998-05-01), Roustaei et al.
patent: 5969853 (1999-10-01), Takaoka
patent: 5969855 (1999-10-01), Ishiwata et al.
patent: 6011874 (2000-01-01), Gluckstad
patent: 6025873 (2000-02-01), Nishioka et al.
patent: 6034814 (2000-03-01), Otaki
patent: 6037579 (2000-03-01), Chan et al.
patent: 6091548 (2000-07-01), Chen
patent: 6097856 (2000-08-01), Hammond, Jr.
patent: 6121603 (2000-09-01), Hang et al.
patent: 6128127 (2000-10-01), Kusaka
patent: 6144493 (2000-11-01), Okuyama et al.
patent: 6172723 (2001-01-01), Inoue et al.
patent: 6172799 (2001-01-01), Raj
patent: 6262818 (2001-07-01), Cuche et al.
patent: 0531926 (1993-03-01), None
patent: 0584769 (1994-03-01), None
patent: 0618473 (1994-10-01), None
patent: 0742466 (1996-11-01), None
patent: 0759573 (1997-02-01), None
patent: 0791846 (1997-08-01), None
patent: 0981245 (2000-02-01), None
patent: 2278750 (1994-12-01), None
patent: 2000-98301 (2000-04-01), None
patent: WO 9957599 (1999-11-01), None
patent: WO 0052516 (2000-09-01), None
J. Ojeda-Castaneda, L. R. Berriel-Valdos, and E. Montes, “Spatial filter for increasing the depth of focus”, Optics Letters, vol. 10, No. 11, p520-522, Nov., 1985.
J. Ojeda-Castaneda, and A. Diaz, “High focal depth by quasibifocus”, vol. 27, No. 20, p4163-4165, Oct. 15, 1988.
J. Ojeda-Castaneda, E. Tepichin, and A. Pons, “Apodization of annular apertures: Strehl ratio”, Applied Optics, vol. 27, No. 24, p 5140-5145, Dec. 15, 1988.
D. L. Marks, R. A. Stack, D. J. Brady, and J. Van Der Gracht, “Three-dimensional tomography using a cubic-phase plate extended depth-of-field system”, Optics Letters, vol. 24, No. 4, p 253-255, Feb. 15, 1999.
S. C. Tucker, W. T. Cathey, and E. R. Dowski, Jr, “Extended depth of field and aberration control for inexpensive digital microscope systems”, Optics Express, vol. 4, No. 11, p467-474, May 24, 1999.
H. Bartelt, J. Ojeda-Castaneda, and E. E. Sicre, “Misfocus tolerance seen by simple inspection of the ambiguity function”, Applied Optics, vol. 23, No. 16, p 2693-2696, Aug. 15, 1984.
J. Ojeda-Castaneda, L. R. Berriel-Valdos, and E. Montes, “Ambiguity function as a design tool for high focal depth”, Applied Optics, vol. 27, No. 4, p 790-795, Feb. 15, 1988.
J. Ojeda-Castaneda, P. Andres, and A. Diaz, “Annular apodizers for low sensitivity to defocus and to spherical aberration”, Optics Letters, vol. 11, No. 8, p 487-489, Aug., 1986.
J. Ojeda-Castaneda, E. Tepichin, and A. Diaz, “Arbitrarily high focal depth with a quasioptimum real and positive transmittance apodizer”, Applied Optics, vol. 28, No. 13, p 2666-2670, Jul. 1, 1989.
J. Ojeda-Castaneda, and L. R. Berriel-Valdos, “Arbitrarily high focal depth with finite apertures”, Optics Letters, vol. 13, No. 3, p 183-185, Mar., 1988.
G. Indebetouw, and H. Bai, “Imaging with Fresnel zone pupil masks: extended depth of field”, Applied Optics, vol. 23, No. 23, p 4299-4302, Dec. 1, 1984.
W. T. Welford, “Use of annular apertures to increase focal depth”, Journal of the Optical Society of America, vol. 50, No. 8, p 749-753, Aug., 1960.
C. Varamit, and G. Indebetouw, “Imaging properties of defocused partitioned pupils”, J. Opt. Soc. Am. A, vol. 2, No. 6, p 799-802, Jun. 1985.
E. R. Dowski Jr., and W. T. Cathey, “Single lens single-image incoherent passive-ranging systems”, Applied Optics, vol. 33, No. 29, p 6762-6773, Oct. 10, 1994.
W. T. Cathey, B. R. Frieden, W. T. Rhodes, and C. K. Rushforth, “Image gathering and processing for enhanced resolution”, J. Opt. Soc. Am. A, vol. 1, No. 3, p 241-250, Mar. 1984.
J. Van Der Gracht, E. R. Dowski Jr., M. G. Taylor, and D. M. Deaver, “Broadband behavior of an optical-digital focus-invariant system”, Optics Letters, vol. 21, No. 13, p 919-921, Jul. 1, 1996.
G. Hausler, “A method to increase the depth of focus by two step image processing”, Optical Communications, vol. 6, No. 1, p 38-42, Sep., 1972.
C. J Cogswell, N. I. Smith, K. G. Larkin, and P. Hariharan, “Quantitative DIC microscopy using a geometric phase shifter”, SPIE, vol. 2984, p72-81,1997.
D. Kermisch, “Partially coherent image processing by laser scanning”, Journal of the Optical Society of America,
Lathrop & Gage LC
Miriam Daniel
The Regents of the University of Colorado
LandOfFree
Combined wavefront coding and amplitude contrast imaging... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Combined wavefront coding and amplitude contrast imaging..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Combined wavefront coding and amplitude contrast imaging... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3402387