Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-04-10
2007-04-10
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S760020, C324S1540PB
Reexamination Certificate
active
11366086
ABSTRACT:
An apparatus, a system, and a method for semiconductor processing automation, specifically for handling, are disclosed herein. In various embodiments, an apparatus for handling comprises a pick-and-place subassembly and a press subassembly.
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Nguyen Ha Tran
Schwabe Williamson & Wyatt P.C.
Vazquez Arleen M.
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