Combined magnetic sector mass spectrometer and time-of-flight ma

Details Combined magnetic sector mass spectrometer and time-of-flight ma Combined magnetic sector mass spectrometer and time-of-flight ma

1991-03-19

1992-12-15

Berman, Jack I.

Radiant energy

Ionic separation or analysis

250283, 250287, 250307, 250309, B01D 5944, H01J 3726

Patent

active

051719878

ABSTRACT:
A mass spectrometry system includes a double-focusing magnetic sector mass spectrometer and a time-of-flight spectrometer arranged in parallel. The spectrometers share a common means for exciting ions from a sample, and a common transfer optics system. An interleaved control system for the two spectrometers, is arranged also to control a sampling handling arrangement dependent on the output of the time-of-flight spectrometer, so as to enable the double-focusing magnetic sector mass spectrometer to analyze a region of interest on a sample.

REFERENCES:
patent: 3686499 (1972-08-01), Omura et al.
patent: 3894233 (1975-07-01), Tamura et al.
patent: 4472631 (1984-09-01), Enke et al.
patent: 4818872 (1989-04-01), Parker et al.
Nuclear Instruments and Methods on Physics Research. B 233 (1984) Nov., No. 2 Amsterdam NL pp. 185-192 L R Kilius et al. Charge Ratio Mass Spectrometry of Heavy Elements.

Affiliated with

Also associated with

Rating

Combined magnetic sector mass spectrometer and time-of-flight ma does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Combined magnetic sector mass spectrometer and time-of-flight ma, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Combined magnetic sector mass spectrometer and time-of-flight ma will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2095233