Combinational data generator and analyzer for built-in self test

Details Combinational data generator and analyzer for built-in self test Combinational data generator and analyzer for built-in self test

1991-11-12

1993-11-02

Beausoliel, Jr., Robert W.

Excavating

371 225, H04B 1700

Patent

active

052589854

ABSTRACT:
A built-in self test (BIST) circuit verifies the operation of a circuit under test in an integrated circuit. The BIST generates a series of test vectors with linear feedback shift register (LFSR) and applies the test vectors to the circuit under test. The output signal from the circuit under test in response to the test vectors is routed back and accumulating in a predetermined manner in the LFSR for providing a test signature. Thus, the same components in the LFSR generating the test vector also perform the accumulation of the test signature. The accumulating test signature may be used as a subsequent test vector.

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patent: 4847839 (1989-07-01), Hudson, Jr. et al.
patent: 4982403 (1991-01-01), Du Chene et al.

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