Column repair circuit

Details Column repair circuit Column repair circuit

2005-10-11

2005-10-11

Phung, Anh (Department: 2824)

Static information storage and retrieval

Addressing

Particular decoder or driver circuit

C365S225700, C365S200000

Reexamination Certificate

active

06954399

ABSTRACT:
A column repair circuit of a semiconductor memory device including a plurality of memory cell array blocks each having the different number of wordlines comprises a predecoder, a block selector, a unit selector and a fuse means. The predecoder decodes a row address. The block selector generates block selecting signals to select the memory cell array blocks. The unit selector generates unit selecting signals to select a size of a row corresponding to the selected memory cell array. The fuse means generates a column repair control signal activated when a column repair is performed on the selected memory cell array block. The column repair circuit performs a column repair operation by a memory cell array block unit, thereby improving column repair efficiency and reducing the number of column repair fuses.

REFERENCES:
patent: 6301164 (2001-10-01), Manning et al.
patent: 6343037 (2002-01-01), Park et al.
patent: 6597608 (2003-07-01), Kang et al.
patent: 6657907 (2003-12-01), Lee
patent: 2003-016795 (2003-01-01), None
patent: 2002-0000694 (2002-01-01), None

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