Column defect detection in a content addressable memory

Details Column defect detection in a content addressable memory Column defect detection in a content addressable memory

2007-10-02

2007-10-02

Phan, Trong (Department: 2827)

Static information storage and retrieval

Associative memories

Ferroelectric cell

C365S189070, C365S207000

Reexamination Certificate

active

11240160

ABSTRACT:
A content addressable memory (CAM) device. For one embodiment, the CAM device includes a CAM array having a plurality of columns of CAM cells, a plurality of storage elements, each for storing a column pass/fail signal indicating whether a corresponding column of CAM cells is designated as good or as bad, and a test circuit having an output coupled to the storage elements, and configured to generate the column pass/fail signals during a column test sequence.

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