Column defect compensating apparatus for CCD image sensor

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry

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358213, H04N 514, H04N 315

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active

044007345

ABSTRACT:
Column defect compensating apparatus for a charge coupled device (CCD) image sensor of the type having a two-dimensional array comprising rows and columns of charge transfer elements, and an output CCD shift register arranged across one end of the columns includes an auxiliary shift register clocked in synchronism with the output shift register, and containing information representing the location of defective columns in the two-dimensional array. A signal processing circuit responsive to the output of the auxiliary shift register processes the output of the array to compensate for the column defects. In a preferred embodiment of the invention, the auxiliary shift register is a CCD shift register, and a plurality of programable input circuits are provided for inserting, in parallel, into the auxiliary CCD shift register, signals representing the condition of the columns of the array. The programable input circuits include input diodes disposed adjacent the cells of the auxiliary shift register for providing a source of signal charge, input gates disposed between the diodes and the respective cells of the auxiliary shift register for selectively isolating the diodes from the cells, and selectively destructible conductors for controlling the transfer of charge from the diodes past the input gates.

REFERENCES:
patent: 4155121 (1979-05-01), Jambotkar
patent: 4167754 (1979-09-01), Nagumo et al.
patent: 4179711 (1979-12-01), Nagumo
patent: 4300163 (1981-11-01), Wada et al.
"Charge Transfer Devices" by Sequin and Thompsett, Academic Press, 1975, p. 153.

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