Color measurement profile with embedded characterization

Image analysis – Color image processing

Reexamination Certificate

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Details

C382S165000, C382S166000, C382S167000

Reexamination Certificate

active

10705920

ABSTRACT:
A data structure by which a color management system can model color behavior of a color device. More particularly, the data structure includes a measurement component including a collection of measurements, where each measurement represents at least one control signal by which a sample color measurement is obtained by effecting a corresponding color output from or input to the color device, or a set of color coordinates which correlate to the at least one control signal, or both. The data structure also includes a characterization process component which includes platform-independent code for a characterization process by which the collection of measurements is processed to produce a color behavior model for the color device. The invention preferably includes a control parameter component which includes control parameters representing a type or state of the device, where the characterization process component processes the collection of measurements in accordance with the control parameters, in order to generate a color transform corresponding to the type or state of the color device.

REFERENCES:
patent: 5103407 (1992-04-01), Gabor
patent: 6043909 (2000-03-01), Holub
patent: 6075888 (2000-06-01), Schwartz
patent: 6088038 (2000-07-01), Edge et al.
patent: 6108442 (2000-08-01), Edge et al.
patent: 6263291 (2001-07-01), Shakespeare et al.
patent: 6307961 (2001-10-01), Balonon-Rosen et al.
patent: 6362808 (2002-03-01), Edge et al.
patent: 6396593 (2002-05-01), Laverty et al.
patent: 6421050 (2002-07-01), Ruml et al.
patent: 6430311 (2002-08-01), Kumada
patent: 6437792 (2002-08-01), Ito et al.
patent: 6477318 (2002-11-01), Ishii
patent: 6480299 (2002-11-01), Drakopoulos et al.
patent: 6535298 (2003-03-01), Winter et al.
patent: 6961461 (2005-11-01), MacKinnon et al.
patent: 7032227 (2006-04-01), Wilkinson et al.
patent: 2001/0012396 (2001-08-01), Kumada
patent: 2001/0038468 (2001-11-01), Hiramatsu
patent: 2001/0044801 (2001-11-01), Senn et al.
patent: 2001/0053247 (2001-12-01), Sowinski et al.
patent: 2002/0003903 (2002-01-01), Engeldrum et al.
patent: 2002/0105660 (2002-08-01), Haikin
patent: 2003/0058253 (2003-03-01), Edge et al.
patent: 01/89202 (2001-11-01), None
patent: 02/080523 (2002-10-01), None

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