Color-filter substrate, method and apparatus for...

Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only

Reexamination Certificate

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C349S123000, C430S007000

Reexamination Certificate

active

07110066

ABSTRACT:
To make it difficult to view streak unevenness in alignment generated at the boundary of alignment layers even when an alignment-layer material is applied onto a color-filter substrate several times to form an alignment layer. When an alignment-layer material is applied onto a color-filter substrate1having color filters (R, G, and B) on the surface with a droplet discharge head3to form an alignment-layer train4a, the lateral front end L1of the train4ais formed on the color filter (B) displaying blue. When the alignment-layer material is then applied to the following alignment-layer application train to form an alignment-layer train4b, the lateral rear end L2of the train4bis overlapped with the lateral front end L1of the preceding alignment-layer train4ato form an overlapped portion4c. Since the overlapped portion4cis formed on the color filter (B) displaying blue which has the lowest visibility of the three primary colors of light, streak unevenness in alignment generated at the boundary is difficult to view from the exterior.

REFERENCES:
patent: 4601546 (1986-07-01), Ohta
patent: 4776675 (1988-10-01), Takaochi et al.
patent: 2003/0043318 (2003-03-01), Kim
patent: 2005/0105017 (2005-05-01), Choi et al.
patent: 2005/0275780 (2005-12-01), Hisatake
patent: A-2001-51269 (2001-02-01), None

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