Coincidence correction in particle analysis system

Details Coincidence correction in particle analysis system Coincidence correction in particle analysis system

1982-02-16

1985-04-09

Tokar, Michael J.

Electricity: measuring and testing

Determining nonelectric properties by measuring electric...

Particle counting

356 72, 377 12, G01N 2700

Patent

active

045104387

ABSTRACT:
Flat beam optical sensing performed transverse of a flow aperture, of the particles passing through the aperture, directly indicates the presence of individual particles in the aperture. The indication can be used to eliminate or otherwise modulate the coincidence errors resulting in particle measurements taken through the length of the aperture.

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