Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1983-07-29
1986-07-15
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
350358, 356352, G01J 902
Patent
active
046003070
ABSTRACT:
This invention relates to unequal path interferometers which are adapted, among other possible uses, for use in detecting coherent radiation as from a laser in a packet of radiation including incoherent background radiation, which includes an unequal optical path length interferometer of the type in which portions of the radiation impinging on the interferometric component are caused to be recombined after travelling two different optical paths; the optical paths differing in length by an amount substantially greater than the coherence length of the non-coherent radiation but substantially less than the coherence length of the coherent radiation; the unequal optical path length interferometric component including a crystalline cell having anisotropic properties; circuitry for applying an ultrasonic sound wave to the crystalline cell to vary the effective index of refraction of the crystalline cell in a preselected systematic manner; a detector for detecting the intensity of the recombined portions and producing a signal representative thereof, said signal having a variable component caused by the varying constructive and destructive interference of the recombined coherent radiation components, while the recombined non-coherent radiation components produce only a substantially steady background signal.
REFERENCES:
patent: 3668558 (1972-06-01), Hunsinger
patent: 3824018 (1974-07-01), Crane, Jr.
patent: 4170416 (1979-09-01), Fencil
patent: 4222667 (1980-09-01), Layne
patent: 4309108 (1982-01-01), Siebert
Abreu Rene
Krohn William T.
McNally Mark J.
Grimes Edwin T.
Koren Matthew W.
Masselle Francis L.
Murphy Thomas P.
The Perkin-Elmer Corporation
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