Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1993-03-15
1995-02-07
Hille, Rolf
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, 356351, 356354, G01B 902
Patent
active
053879724
ABSTRACT:
A plurality of signals are mixed in a non-linear waveguide for generating a near field sum frequency output pattern. The near field output pattern is monitored for changes which correspond to changes in the phase relationship between the plurality of signals. A grating provides a mask through which the near field pattern may propagate. Detectors positioned above the grating at predetermined locations measure the intensity of the near field pattern and a change in the phase relationship between the input signals is determined from a change in the intensity of the near field output pattern.
REFERENCES:
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patent: 5111466 (1992-05-01), Normandin et al.
patent: 5120131 (1992-06-01), Lukosz
patent: 5200795 (1993-04-01), Kim et al.
patent: 5239364 (1993-08-01), Matsuzaki
patent: 5255068 (1993-10-01), Emo et al.
Chatenoud Francoise
Dai Hongxing
Frlan Edward
Janz Siegfried
Normandin Richard
Hille Rolf
National Research Council of Canada
Tran Minhloan
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