Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-06-04
2000-02-29
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, G01B 902
Patent
active
06031611&
ABSTRACT:
A system and method for determining a curvature of a specularly reflective surface based on optical interference. Two optical gratings are used to produce a spatial displacement in an interference field of two different diffraction components produced by one grating from different diffraction components produced by another grating. Thus, the curvature of the surface can be determined.
REFERENCES:
patent: 5387795 (1995-02-01), Ishida et al.
patent: 5572323 (1996-11-01), Maeda et al.
Kolawa Elizabeth
Moore, Jr. Nicholas R.
Rosakis Ares J.
Singh Ramen P.
California Institute of Technology
Kim Robert H.
Lee Andrew H.
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