X-ray or gamma ray systems or devices – Specific application – Absorption
Patent
1997-11-07
1999-08-17
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Absorption
378 87, G01N 2304
Patent
active
059404680
ABSTRACT:
An X-ray imaging system which measures X-rays scattered by material concealed within an enveloping surface. A beam of X-ray radiation is incident on the enveloping surface and scattered onto one or more arrays of detectors. One or more masks of material opaque to X-ray transmission but for a series of apertures is interposed between the object and the detectors so as to cast shadows on different parts of the detector array. The image of the scattering material, as detected at the detector array, is modulated by the pattern of mask apertures. A controller reconstructs the image of the illuminated line. By scanning the illumination with respect to the object, an image of the entire object in scattered radiation is obtained, while use of multiple arrays or variation of geometrical settings allows reconstruction of the source of scattering in three dimensions.
REFERENCES:
patent: 4209780 (1980-06-01), Fenimore et al.
patent: 4423522 (1983-12-01), Harding
patent: 5247561 (1993-09-01), Kotowski
Huang Suzhou
Hynes Michael V.
American Science and Engineering, Inc.
Porta David P.
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