Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-02-20
2007-02-20
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S693000, C324S754090
Reexamination Certificate
active
10862464
ABSTRACT:
A coaxial probe includes an inner conductor, an outer conductor, and a dielectric interposed between the inner and outer conductors, the top-end portion of the coaxial probe having a substantially circular cone shape between the top-end of the inner conductor and the end of the outer conductor so that a portion of the inner conductor and a portion of the dielectric are exposed, and the height of the substantially circular cone portion being set at a value at which a reflection coefficient exhibits substantially a minimum value. The dielectric constant of the dielectric is preferably within the range of about 0.132 times to about 0.6 times as large as the dielectric constant of a surrounding substance (living tissue, i.e., an object to which an electromagnetic wave is irradiated).
REFERENCES:
patent: 5358515 (1994-10-01), Hurter et al.
patent: 6813515 (2004-11-01), Hashimshony
patent: 2006/0155270 (2006-07-01), Hancock et al.
patent: 07-275247 (1995-10-01), None
Kitazawa Toshihide
Wakino Kikuo
Benson Walter
Keating & Bennett LLP
Murata Manufacturing Co. Ltd.
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