Coaxial multiple reflection time-of-flight mass spectrometer

Details Coaxial multiple reflection time-of-flight mass spectrometer Coaxial multiple reflection time-of-flight mass spectrometer

1997-05-30

2000-08-22

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

250282, B01D 5944, H01J 4900

Patent

active

061076252

ABSTRACT:
The present invention relates generally to time-of-flight mass spectrometers and discloses an improved method and apparatus for analyzing ions using a time-of-flight mass spectrometer. More specifically, the present invention comprises two or more electrostatic reflectors positioned coaxially with respect to one another such that ions generated by an ion source can be reflected back and forth between them. The first reflecting device is an ion accelerator which functions as both an accelerating device to provide the initial acceleration to the ions, and a reflecting device to reflect the ions in the subsequent mass analysis. The second reflecting device is a reflectron which functions only to reflect the ions in the mass analysis. During the mass analysis, the ions are reflected back and forth between the accelerator and reflectron multiple times. Then, at the end of the ion analysis, either of the reflecting devices, preferably the ion accelerator, is rapidly deenergized to allow the ions to pass through that reflecting device and into a detector. By reflecting the ions back and forth between the accelerator and reflectron several times, a much longer flight path can be achieved in a given size spectrometer than could otherwise be achieved using the time-of-flight mass spectrometers disclosed in the prior art. Consequently, the mass resolving power of the time-of-flight mass spectrometer of the present invention is substantially greater than that of the prior art.

REFERENCES:
patent: 4072862 (1978-02-01), Mamyrin et al.
patent: 4164754 (1979-08-01), Dubois
patent: 4625112 (1986-11-01), Yoshida
patent: 5144127 (1992-09-01), Willams et al.
patent: 5266136 (1993-11-01), Kanome et al.
patent: 5572035 (1996-11-01), Franzen
patent: 5641959 (1997-06-01), Holle et al.
patent: 5654545 (1997-08-01), Holle et al.
patent: 5739529 (1998-04-01), Laukien et al.

Affiliated with

Also associated with

Rating

Coaxial multiple reflection time-of-flight mass spectrometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Coaxial multiple reflection time-of-flight mass spectrometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Coaxial multiple reflection time-of-flight mass spectrometer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-583751