Co-planar electromagnetic profile scanner

Details Co-planar electromagnetic profile scanner Co-planar electromagnetic profile scanner

1997-03-24

1999-11-16

Laufer, Pinchus M.

Optics: measuring and testing

Range or remote distance finding

Triangulation ranging to a point with one projected beam

356372, 382106, 25055923, G01B 1124, G01C 700

Patent

active

059867450

ABSTRACT:
A co-planar system for determining the shape and dimensions of a surface of an object includes a projector for projecting in a selected plane onto the object a spatially coded pattern of radiation, e.g., light. The system also includes a receiving device capable of imaging the reflected pattern in the selected plane, and a discriminator for determining which portion of the reflected pattern corresponds to which portion of the projected pattern. By this means, a received signal representing less than the complete reflection from the projected pattern can be correlated with a discrete portion of the scanned object. The object is moved relative to the selected plane and the procedure repeated to obtain enough reliable data to generate a reasonably reliable surface profile. The resulting set of received signals and correlations are used to calculate the shape and dimensions of the object.

REFERENCES:
patent: Re32984 (1989-07-01), Rosenfeld et al.
patent: 3543241 (1970-11-01), Leuck
patent: 3617707 (1971-11-01), Shields et al.
patent: 3699312 (1972-10-01), Jones et al.
patent: 3761685 (1973-09-01), Alpert et al.
patent: 3866052 (1975-02-01), Di Matteo et al.
patent: 4188544 (1980-02-01), Chasson
patent: 4192613 (1980-03-01), Hammar
patent: 4197888 (1980-04-01), McGee et al.
patent: 4613234 (1986-09-01), Cruickshank
patent: 4634278 (1987-01-01), Ross et al.
patent: 4645348 (1987-02-01), Dewar et al.
patent: 4648717 (1987-03-01), Ross et al.
patent: 4667099 (1987-05-01), Arai et al.
patent: 4687325 (1987-08-01), Corby, Jr.
patent: 4794550 (1988-12-01), Greivenkamp, Jr.
patent: 4846577 (1989-07-01), Grindon
patent: 4867570 (1989-09-01), Sorimachi et al.
patent: 4900146 (1990-02-01), Penney et al.
patent: 4937445 (1990-06-01), Leong et al.
patent: 4941100 (1990-07-01), McFarlane et al.
patent: 5041726 (1991-08-01), Chang et al.
patent: 5201351 (1993-04-01), Hurdle, Jr.
patent: 5307151 (1994-04-01), Hof et al.
patent: 5326961 (1994-07-01), Sibata et al.

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