Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Graded composition
Reexamination Certificate
2006-09-18
2008-11-11
Tran, Long K (Department: 2818)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Graded composition
C438S724000, C438S727000, C438S285000, C438S583000, C438S604000
Reexamination Certificate
active
07449353
ABSTRACT:
Semi-insulating Group III nitride layers and methods of fabricating semi-insulating Group III nitride layers include doping a Group III nitride layer with a shallow level p-type dopant and doping the Group III nitride layer with a deep level dopant, such as a deep level transition metal dopant. Such layers and/or method may also include doping a Group III nitride layer with a shallow level dopant having a concentration of less than about 1×1017cm−3and doping the Group III nitride layer with a deep level transition metal dopant. The concentration of the deep level transition metal dopant is greater than a concentration of the shallow level p-type dopant.
REFERENCES:
patent: 4481523 (1984-11-01), Osaka et al.
patent: 4782034 (1988-11-01), Dentai et al.
patent: 4946547 (1990-08-01), Palmour et al.
patent: 5200022 (1993-04-01), Kong et al.
patent: 5210051 (1993-05-01), Carter, Jr.
patent: 5292501 (1994-03-01), Degenhardt et al.
patent: RE34861 (1995-02-01), Davis et al.
patent: 5393993 (1995-02-01), Edmond et al.
patent: 5523589 (1996-06-01), Edmond et al.
patent: 5592501 (1997-01-01), Edmond et al.
patent: 6156581 (2000-12-01), Vaudo et al.
patent: 6218680 (2001-04-01), Carter, Jr. et al.
patent: 6596079 (2003-07-01), Vaudo et al.
patent: 2001/0008656 (2001-07-01), Tischler et al.
patent: 2001/0015437 (2001-08-01), Ishii et al.
Armitage et al “Contributions from Gallium Vacancies and Carbon-Related Defects to the “Yellow Luminescence” in GaN”Applied Physics Letters82(20):3457-3459 (2003).
B. Streetman,Solid State Electronic Devices, 2ndEd. 1980, pp. 79-81, 127, and 183-185.
Heikman et al. “Growth and characteristics of Fe-doped GaN,”Journal of Crystal Growth, vol. 248, Feb. 2003, pp. 513-517.
Heikman et al “Growth of Fe Doped Semi-Insulating GaN by Metalorganic Chemical Vapor Deposition”Applied Physics Letters81(3):439-441 (2002).
Heikman et al. “Growth of Fe-doped semi-insulating GaN by metalorganic chemical vapor deposition,”Applied Physics Letters, vol. 81, No. 3, Jul. 15, 2002, pp. 439-441.
International Search Report and Written Opinion of International Application Serial No. PCT/US2004/031982 mailed on Mar. 10, 2005.
Jenny et al. “On the compensation mechanism in high-resistivity 6H-SiC doped with vanadium,”Journal of Applied Physics, vol. 78, No. 6, Sep. 15, 1995, pp. 3839-3842.
Jenny et al. “Deep level transient spectroscopic and Hall effect investigation of the position of the vanadium acceptor level in 4H and 6H SiC,”Applied Phyics Letters, vol. 68, No. 14, Apr. 1, 1996, pp. 1963-1965.
Kim et al. “Improvement of magnetic property of GaMnN by codoping of Mg,”Journal of Applied Physics, vol. 93, No. 10, May 15, 2003, pp. 6793-6795.
Korotkov et al “Optical Study of GaN: Mn co-doped with Mg Grown by Metal Organic Vapor Phase Epitaxy”Physica B308-310: 18-21.
Li et al “Surface Polarity Dependence of Mg Doping in GaN Grown by Molecular-Beam Epitaxy”Applied Physics Letters76(13):1740-1742 (2000).
Polyakov et al. “Electrical and optical properties of Cr and Fe implantedn-GaN,”Journal of Applied Physics, vol. 93, No. 9, May 1, 2003, pp. 5388-5396.
Ringel et al “Detection of Carbon-Related Bandgap States in GaN Using Deep Level Optical Spectroscopy”IEEE International Symposium on Compound Semiconductors4-5 (2003).
Seager et al “Role of Carbon in GaN”Journal of Applied Physics92(11):6553-6560 (2002).
Tang et al. “Properties of carbon-doped GaN,”Applied Physics Letters, vol. 78, No. 6, Feb. 5, 2001, pp. 757-759.
Witte et al “Deep Defects in Fe-Doped GaN Layers Analysed by Electrical and Photoelectrical Spectroscopic Methods”Mat. Res. Soc. Symp. Proc.798:575-580 (2003).
Cree Inc.
Myers Bigel & Sibley & Sajovec
Tran Long K
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