CMP polishing pad having grooves arranged to improve...

Abrading – Flexible-member tool – per se – Interrupted or composite work face

Reexamination Certificate

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Details

C451S530000

Reexamination Certificate

active

07059950

ABSTRACT:
A polishing pad (104, 304, 404, 504) having an annular polishing track (152, 312, 412, 512) for polishing a wafer (120, 316, 416, 516). A plurality of grooves (112, 320, 420, 520) are arranged within the wafer track so that they are spaced from one another both radially and circumferentially relative to the rotational nature of pad and are at least partially non-circumferential relative to the pad.

REFERENCES:
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patent: 5645469 (1997-07-01), Burke et al.
patent: 5650039 (1997-07-01), Talieh
patent: 5990012 (1999-11-01), Robinson et al.
patent: 6089966 (2000-07-01), Arai et al.
patent: 6120366 (2000-09-01), Lin et al.
patent: 6241596 (2001-06-01), Osterheld et al.
patent: 6843711 (2005-01-01), Muldowney
patent: 2002/0068516 (2002-06-01), Chen et al.
patent: 2002/0083577 (2002-07-01), Suzuki
patent: 1 114 697 (2001-07-01), None

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