Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Reexamination Certificate
2007-10-30
2007-10-30
Luu, Thanh X. (Department: 2878)
Radiant energy
Photocells; circuits and apparatus
Photocell controlled circuit
C250S2140DC
Reexamination Certificate
active
10620829
ABSTRACT:
A radiation measuring technique includes adjusting a threshold level of a radiation sensor in a radiation-measuring circuit and obtaining an output signal based on radiation dose sensed by the radiation sensor.
REFERENCES:
patent: 5105078 (1992-04-01), Nochise et al.
patent: 5481118 (1996-01-01), Tew
patent: 5694448 (1997-12-01), Morcom
patent: 6141243 (2000-10-01), Aslam et al.
patent: 6388494 (2002-05-01), Kindt et al.
patent: 6404269 (2002-06-01), Voldman
patent: 6649898 (2003-11-01), Fleischer et al.
patent: 6794630 (2004-09-01), Keshavarzi et al.
patent: 2001/0019285 (2001-09-01), Lin et al.
Kelleher et al., IEEE, “Development of the Radiation Sensitivity of PMOS Dosimeters—Dèvelopment de la Sensibilitè aux Radiations de Dosimètres PMOS”, pp. 342-346 (1992).
Ma et al., “Ionizing Radiation Effects in Mos Devices and Circuits”, John Wiley & Sons, pp. 262, 265-267 (1989).
Moreno et al., “CMOS Radiation Sensor with Binary Output”, IEEE Transactions on Nuclear Science, vol. 42, No. 3, pp. 174-178, Jun. 1995.
Ray et al., IEEE Transactions on Nuclear Science, “CRRES Dosimetry Results and Comparisons Using the Space Radiation Dosimeter and P-Channel MOS Dosimeters”, vol. 39, No. 6, pp. 1846-1850, Dec. 1992.
De Vivek K.
Keshavarzi Ali
Segura Jaume A.
Fish & Richardson P.C.
Luu Thanh X.
LandOfFree
CMOS radiation-measuring circuit with a variable threshold does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with CMOS radiation-measuring circuit with a variable threshold, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and CMOS radiation-measuring circuit with a variable threshold will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3856317