Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-10-24
1999-08-17
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
364578, G01R 3128, G06F 9455
Patent
active
059398949
ABSTRACT:
A CMOS integrated circuit is tested by creating a database in which types of CMOS functional units of the integrated circuit are mapped to values of quiescent power supply currents which would flow through the functional units corresponding to all possible internal states of the integrated circuit. A test pattern is applied to a simulation model of the functional units of the integrated circuits and an output is detected therefrom. Corresponding to the output of the simulation model, values of the quiescent power supply currents are read from the database and a decision threshold is derived from a total sum of the read values. A power supply current of the integrated circuit is then measured while subjecting it to the test pattern and the measured current is compared with the decision threshold to produce a test result of the integrated circuit.
REFERENCES:
patent: 5392293 (1995-02-01), Hsue
patent: 5731700 (1998-03-01), McDonald
"IEEE Design & Test of Computers", IEEE Computer Society, pp. 42-52, Summer (1995).
Inomata Yoshiyuki
Tajima Fumihiko
Yamauchi Hisashi
Karlsen Ernest F.
NEC Corporation
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