CMOS integrated circuit device and inspection method thereof

Details CMOS integrated circuit device and inspection method thereof CMOS integrated circuit device and inspection method thereof

1998-07-24

2000-02-08

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Specific identifiable device, circuit, or system

With specific source of supply or bias voltage

327535, 257371, H03K 301

Patent

active

060231866

ABSTRACT:
A CMOS integrated circuit device enabling accurate inspection of its static power source current includes: a CMOS circuit having a p-channel MOS transistor and an n-channel MOS transistor; a first pad connected to the source of the p-channel MOS transistor; a second pad connected to the source of the n-channel MOS transistor; a p-type diffused region formed in an n-type substrate or n-well having formed the p-channel MOS transistor; an n-type diffused region formed in the p-type substrate or p-well having formed the n-channel MOS transistor; a third pad connected through the p-type diffused region to the n-type substrate or n-well having formed the p-channel MOS transistor; and a fourth pad connected through the n-type diffused region to the p-type substrate or p-well having formed the n-channel MOS transistor.

REFERENCES:
patent: 4791317 (1988-12-01), Winner et al.
patent: 5159207 (1992-10-01), Pavlin et al.
patent: 5311073 (1994-05-01), Dallavalle
patent: 5625300 (1997-04-01), Sachdev
patent: 5838047 (1998-11-01), Yamauchi et al.

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