CMOS inspection apparatus

Details CMOS inspection apparatus CMOS inspection apparatus

2005-10-25

2005-10-25

Garber, Wendy R. (Department: 2612)

Television

Special applications

Manufacturing

C348S092000, C348S294000

Reexamination Certificate

active

06958768

ABSTRACT:
A system for inspecting components is provided. The system includes a CMOS imaging system generating image data, such as pixel data from a pixel array. An image analysis system is connected to the CMOS imaging system, the image analysis system receiving the image data and generating image analysis data. The CMOS imaging system generates the image data at a rate that allows the CMOS imaging device to be used for inspecting components.

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patent: 6515701 (2003-02-01), Clark et al.
patent: 6519371 (2003-02-01), Pain et al.
patent: 6681038 (2004-01-01), Vilella
A. Krymski et al.; “A High Speed, 500 Frames/s, 1024+1024 CMOS Active Pixel Sensor”1999 Symposium of VLSI Circuits of Technical Papers, Jun. 1999, pp. 137-138.
E. R. Fossum; “Acitve Pixel Sensors: Are CCD's Dinosaurs?” Proc. SPIE, Feb. 1993, vol. 1900 pp. 2-14.
E. Fossum; “High Speed CMOS Imaging” Digest of the LEOS Summer Topical Meetings, Jul. 24-28, 2000, pp. 13-14.
A. Krymski et al.; “A High Speed, 500 Frames/s, 1024×1024 CMOS Active Pixel Sensor”1999 Symposium of VLSI Circuits of Technical Papers, Jun. 1999, pp. 137-138.

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