CMOS image sensor with reduced 1/ f noise

Details CMOS image sensor with reduced 1/ f noise CMOS image sensor with reduced 1/ f noise

2004-05-10

2008-10-07

Ho, Tuan (Department: 2622)

Television

Camera, system and detail

Solid-state image sensor

C348S241000

Reexamination Certificate

active

07432968

ABSTRACT:
A CMOS image sensor includes a plurality of pixel circuits. Each pixel circuit includes a plurality of transistors. The image sensor includes a controller for controlling operation of the plurality of pixel circuits, wherein the controller is configured to cause at least one of the transistors in each pixel circuit to be placed in an accumulation mode and then switched from the accumulation mode to a strong inversion mode, thereby reducing 1/f noise of the pixel circuits.

REFERENCES:
patent: 6559719 (2003-05-01), Sakuragi
patent: 6621125 (2003-09-01), Wang
patent: 2003/0025816 (2003-02-01), Sakuragi
Translated German Office Action mailed Jun. 30, 2006 (15 pgs.)
I. Bloom et al., American Institute of Physics pubication entitled “1/f Noise Reduction of Metal-Oxide-Semiconductor Transistors by Cycling from Inversion to Accumulation,” pp. 1664-1666; August 15, 1990.
S. Mendis et al., IEEE Journal of Solid-State Circuits publication entitled “CMOS Active Pixel Image Sensors for Highly Integrated Imaging Systems,” vol. 32, No. 2; pp. 187-197; Feb. 1997.
E. A.M. Klumperink et al., IEEE Journal of Solid-State Circuits publication entitled “Reducing MOSFET 1/f Noise and Power Consumption by Switched Biasing,” vol. 35, No. 7; pp. 994-1001; Jul. 2000.
H. Tian et al., Proceedings of SPIE publication entitled “Analysis of 1/f Noise in CMOS APS,” vol. 3965; pp. 168-176; 2000.
H. Tian et al., IEEE Transactions on Circuits and Systems—II: Analog and Digital Signal Processing publication entitled “Analysis of 1/f Noise in Switched MOSFET Circuits”; vol. 48, No. 2; pp. 151-157; Feb. 2001.
Eastman Kodak Company DS00-001 application note entitled “Solid State Image Sensors Technology”; 55 pgs.; © Dec. 8, 1994.
Klumperink et al. article entitled “Reducing MOSFET 1/f Noise and Power Consumption by Switched Biasing” for IEEE Journal of Solid-State Circuits, Vo. 35, No. 7; Jul. 2000.
E. R. Fossum web article entitled “CMOS Image Sensors Combat Noise” for EETimes; 2 pgs; May 3, 2002.

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