CMOS image sensor capable of performing analog correlated...

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion

Reexamination Certificate

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C341S155000

Reexamination Certificate

active

11319561

ABSTRACT:
A complementary metal oxide semiconductor (CMOS) image sensor capable of performing an analog correlated double sampling method is provided. The CMOS image sensor includes an image capturing unit for capturing an analog signal corresponding to an image of a subject; an analog-digital converting unit for converting the analog signal into a digital signal by using a ramp signal decreasing in a fixed slope according to a reference clock; a ramp signal generation unit for providing the ramp signal to the analog-digital converter; and a control unit for providing said units with control signals and outputting data to the outside through an interface.

REFERENCES:
patent: 6727486 (2004-04-01), Choi

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