Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal
Reexamination Certificate
2006-05-16
2006-05-16
Jackson, Jerome (Department: 2815)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
C438S199000, C257S291000
Reexamination Certificate
active
07045380
ABSTRACT:
An image sensor and a fabricating method thereof are provided. The image sensor includes a floating diffusion region disposed at a predetermined region of a substrate, a photodiode region, and a source plug disposed on the floating diffusion region. Further, the sensor includes conductive patterns that may be used as gate electrodes of transistors. The conductive pattern and the source plug may have the same thickness and composition. Preferably, the source plug and the conductive pattern are made of polysilicon containing impurities. The fabricating method includes forming an insulating pattern on the semiconductor substrate having an opening exposing a predetermined region of the substrate, and forming a conductive pattern across the opening on the resultant structure. The conductive pattern may be made of polysilicon containing impurities. The impurities contained in the gate conductive pattern may be diffused to the substrate through the opening in the gate insulating pattern to form the floating diffusion region in the semiconductor substrate below the opening. As a result, lattice defects and etch damage in the floating diffusion region are minimized.
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Diaz José R.
F. Chau & Associates LLC
Jackson Jerome
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