Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2006-01-03
2006-01-03
Mulpuri, Savitri (Department: 2812)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S237000
Reexamination Certificate
active
06982186
ABSTRACT:
A CMOS image sensor and a method for manufacturing the same, capable of preventing an interface between an active region and a field region in the CMOS image sensor from being damaged by ion implantation. The method comprises implanting dopant ions into a source region between a gate electrode of the reset transistor and the photodiode, using an ion implantation mask that covers predetermined locations of the field region and the source region.
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Han Jin Su
Jeon In Gyun
Kim Kwang Soo
DongbuAnam Semiconductor Inc.
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Mulpuri Savitri
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