Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2009-09-04
2011-10-04
Malsawma, Lex (Department: 2892)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C257S432000, C257SE31127
Reexamination Certificate
active
08030116
ABSTRACT:
A CMOS image sensor and a method for fabricating the same are disclosed. The method includes forming a plurality of color filters on a substrate, each color filter having a curvature, and forming microlenses on the color filters that each has a radius of curvature that varies with the wavelength of the color filter on which it is formed.
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Eun Ji Kim; “CMOS Image Sensor Having Triple Micro-Lens Structure and Method for Manufacturing the Same”; Korean Patent Abstracts; Publication No. 1020060077064 A; Publication Date: Jul. 5, 2006; Korean Intellectual Property Office, Republic of Korea.
Won Ho Lee; “Image Sensor and its Fabricating Method to Increase the Quantity of the Light Irradiated to a Photodiode Through Each Color Filter”; Korean Patent Abstracts; Publication No. 1020070071016 A; Publication Date: Jul. 4, 2007; Korean Intellectual Property Office, Republic of Korea.
Dongbu Hi-Tek Co., Ltd.
Fortney Andrew D.
Malsawma Lex
The Law Offices of Andrew D. Fortney
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