CMOS compatable fabrication of power GaN transistors on a...

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

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C257SE29246, C257SE29249

Reexamination Certificate

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07968913

ABSTRACT:
In an AlGaN channel transistor formed on a <100> orientation silicon wafer, a hole with walls slanted at 54 degrees is etched into the silicon to provide a <111> orientation substrate surface for forming the AlGaN channel transistor.

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patent: 2009/0261346 (2009-10-01), Chen et al.
patent: 2010/0129992 (2010-05-01), Murata et al.

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