Cluster-based defect detection testing for disk drives

Details Cluster-based defect detection testing for disk drives Cluster-based defect detection testing for disk drives

2006-11-21

2006-11-21

Young, Wayne (Department: 2627)

Dynamic magnetic information storage or retrieval

General processing of a digital signal

Data verification

C360S025000, C360S048000, C360S051000, C360S077040

Reexamination Certificate

active

07139145

ABSTRACT:
Disclosed are techniques related to cluster-based defect detection testing for disk drives. A disk drive comprises a disk, a moveable head to scan the tracks of the disk, and a defect detection circuit to detect defects on the disk scanned by the moveable head. The disk drive includes a microprocessor for controlling operations in the disk drive including cluster-based defect detection. The microprocessor under the control of a cluster detection program defines a scan window. The scan window corresponds to an area of the disk scanned by the moveable head. The microprocessor under the control of the cluster detection program further defines a cluster threshold corresponding to a minimum number of defects required to occur within the scan window and identifies a defect cluster if a cluster threshold of defects occurs within the scan window. By identifying defect clusters on the disk these defect clusters can be margined.

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