Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2007-09-25
2007-09-25
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
C250S201900
Reexamination Certificate
active
11130061
ABSTRACT:
A system capable of determining wavefront characteristics, such as air induced wavefront aberrations, includes a field programmable gate array (FPGA) device executing a phase diversity algorithm. The FPGA device can be a stand-alone device or comprise multiple FPGAs. The device receives an “in-focus” and an “out-of-focus” image having a known optical difference from that of the “in-focus” image. The device then performs as many phase diversity algorithm iterations as desired to reach an expression for the wavefront aberrations induced on the collected image data. The resulting wavefront data may be used to produce an enhanced image of the original image data. Example applications include remote sensors and targeting systems, and both passive imaging and active projection systems that compensate for wavefront anomalies.
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Dolne Jean J.
Menicucci Paul J.
Schall Harold B.
Giglio Bryan J
Klintworth Timothy K.
Wildman Harrold Allen & Dixon LLP
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