Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2008-06-10
2008-06-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
Reexamination Certificate
active
07386410
ABSTRACT:
A variable reference voltage circuit controllable in closed loop, for calibrating off-chip and on-chip drivers, margining and optimizing a reference voltage, for interfaces such as DDR2 or any other suitable interface. In one example, the on-chip variable reference voltage circuit, coupled to external fixed reference voltage, includes control logic and an array of switchable resistor elements (pull-up and pull-down resistors) that may each be selectively switched in or out of the circuit to change the reference voltage being supplied to an on-chip receiver.
REFERENCES:
patent: 6515917 (2003-02-01), Lamb et al.
patent: 2006/0038577 (2006-02-01), Jang
JEDEC Solid State Technology Association; JEDEC Standard DDR2 SDRAM Specification; Jan. 2004; pp. 1-74.
ATI Technologies Inc.
Barlow John
Cherry Stephen J
Vedder Price P.C.
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