Oscillators – With frequency calibration or testing
Reexamination Certificate
2008-01-10
2010-12-28
Pascal, Robert (Department: 2817)
Oscillators
With frequency calibration or testing
C331S074000, C331S00100A, C327S156000
Reexamination Certificate
active
07859346
ABSTRACT:
A clock generator with extended tuning range and associated method is provided. The associated self-test and switching-control method includes steps of generating a primary clock signal by a phase-locked loop circuit; determining a frequency limit of the primary clock signal; and determining a frequency-dividing condition of the frequency-dividing module according to the frequency limit and the target frequency.
REFERENCES:
patent: 5381085 (1995-01-01), Fischer
patent: 5900784 (1999-05-01), O'Sullivan
patent: 7205853 (2007-04-01), Miki
patent: 7400130 (2008-07-01), Naujokat et al.
patent: 7528665 (2009-05-01), Coppola et al.
patent: 2007/0001770 (2007-01-01), Wang et al.
Johnson Ryan
Kirton & McConkie
MSTAR Semiconductor, Inc.
Pascal Robert
Witt Evan R.
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