Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate
Reexamination Certificate
2008-06-27
2011-10-18
Bhat, Aditya (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Time duration or rate
Reexamination Certificate
active
08041537
ABSTRACT:
Embodiments of the disclosure provide systems and methods for clock duty cycle measurement. A clock signal and a complement of the clock signal are provided to a charge pump during first and second predetermined timing windows. A charge pump is operable to generate first and second output voltages in response to the clock signal and the complement of the clock signal during the first and second timing windows, respectively. In addition a predetermined positive voltage and a ground voltage are applied to the charge pump during predetermined third and fourth timing windows, respectively. The charge pump is operable to generate third and fourth output voltage signals corresponding to the predetermined positive and ground voltages during the third and fourth timing windows, respectively. The first, second, third and fourth voltages are then used to calculate the duty cycle of the clock.
REFERENCES:
patent: 4859944 (1989-08-01), Webb
patent: 5542083 (1996-07-01), Hotta et al.
patent: 6664834 (2003-12-01), Nair et al.
patent: 2003/0042957 (2003-03-01), Tamura
patent: 2005/0225314 (2005-10-01), Belleau
Boerstler David William
Hailu Eskinder
Kaneko Masaaki
Qi Jieming
Bhat Aditya
Hamilton Gary W.
Hamilton & Terrile LLP
International Business Machines - Corporation
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