Geometrical instruments – Distance measuring – Opposed contacts
Reexamination Certificate
1999-04-27
2001-04-24
Bennett, G. Bradley (Department: 2859)
Geometrical instruments
Distance measuring
Opposed contacts
C033S549000
Reexamination Certificate
active
06219932
ABSTRACT:
CROSS-REFERENCE TO RELATED APPLICATIONS
Not applicable.
BACKGROUND
1. Field of Invention
This invention relates to accessories for a micrometer, specifically to those accessories which are attachable to, and detachable from a conventional outside micrometer.
2. Description of Prior Art
Attachments for a conventional outside micrometer are commonly used in the manufacturing and machining industries. The general function of these attachments is to facilitate accurate measurement taking of specific part or material shapes.
There are two types known to this inventor. Both types modify the interface between the micrometer and the item being measured. The first type mounts directly over the micrometer spindle or anvil measuring faces and is commonly retained to them by a rubber attachment boot or sleeve apparatus. These are commonly known as anvil and spindle attachments. As found, all of these attachments add a length to the anvil or spindle, which must be subtracted from the measurement. None have been found to create a platform, surface, or “table” to support or align the measured item.
The second type consists of specialty micrometers which employ interchangeable spindles or anvils of various configuration. None of them have been found to create a table to support or align the measured item. Micrometer stands might be considered add-on accessories, however they support the micrometer itself, and again do not support or align the measured item.
There are only two micrometer-type measuring tools known to this inventor which do support or align the measured item. One is known as a “wire micrometer”. It is a specialty micrometer, not an add-on accessory for a conventional micrometer. The table of a wire micrometer is a non-removable part of the micrometer itself. The table configuration greatly reduces the clearance to measure most common items. There is no clearance loop, or “throat” between the spindle and the anvil, as there is on a conventional micrometer. The inability to measure most common items, and the prohibitive expense of this specialty tool, tends to limit sales to specific industries such as the wire forming industry.
In addition, wire micrometers are not easily held and utilized in one hand. The throat loop of a conventional micrometer is normally grasped between the tip of the pinky finger and the palm of the hand. This allows the micrometer to be positively retained, while the measuring adjustment (barrel rotation) is accomplished with the thumb and index finger. Therefore, the normal operation of a conventional micrometer is one-handed, allowing the other hand to hold the item being measured. Although a wire micrometer may be held in one hand, there is no throat loop to be grasped, thus it may easily be dropped. Another disadvantage of the wire micrometer table is that it is narrow, generally about 13 mm. wide. It is difficult to stabilize many measured items on this small surface area. The normal measuring range is only zero to 13 mm. or less, compared to the conventional micrometer measuring range of zero to 25.4 mm. The table is also not free to rotate about the measurement axis. To measure a stationary item, the wire micrometer itself must be positioned so that the “table” rests flat against the item. This often requires the scale or digital readout to be facing at an angle away from the operator.
The other type of micrometer found to incorporate a table surface on which the measured item may be supported is known as a bench micrometer. A bench micrometer has an integral heavy base. It is not a hand held tool. It is designed to rest stationary on a workbench, therefore the object to be measured is brought to it. The table surface of a bench micrometer is an integral part of the tool, not an attachment. Also as found, the table surface does not have rotational self-aligning capability.
U.S. Pat. No. 5,463,818 to Hughes (1994), and U.S. Pat. No. 5,287,631 to Stade (1991), disclose micrometer-type measuring tools with tables on which to rest the measured item. However, they are also bench type micrometers, not attachments to a conventional micrometer.
SUMMARY
The object of the present invention is to aid in the alignment of certain items between the measuring faces of a conventional micrometer. The object is also for the present invention to be quickly and easily attached to, and removed from the micrometer.
Objects and Advantages
Accordingly, several objects and advantages of the preferred embodiment of the present invention are:
(a) to create a table surface aligned parallel to the measurement axis of a conventional micrometer on which to position an item between the measuring faces of the micrometer.
(b) to attach to a micrometer by radial capture of the anvil and spindle. This allows the table surface of the present invention to rotate axially around the measurement axis, yielding axial self-alignment capability to items in a fixed position.
(c) to not affect or alter the interface between the micrometer measuring faces and the measured item. There is no add-on item whose length must be subtracted from the measurement.
(d) to provide an attachment mechanism allowing rapid installation and removal from the micrometer without reducing the measurement range.
(e) to not affect the portability or normal one-handed operation of a conventional micrometer.
(f) to provide a table surface of adequate width and length to properly support flat, thin profile items within the entire micrometer measurement range.
(g) to provide a depressed V-groove in the table surface so as to align and support cylindrical items parallel to the measurement axis.
(h) to be manufactured of molded plastic, of a durometer softer than the micrometer measuring faces and body, so as to eliminate the possibility of damage to them.
Further objects and advantages of the present invention will become apparent from a consideration of the drawings and ensuing description.
REFERENCES:
patent: 694804 (1902-03-01), Stromberg
patent: 1269756 (1918-06-01), Slocomb
patent: 1956871 (1934-05-01), Mayman
patent: 2401951 (1946-06-01), Martinec
patent: 2692438 (1954-10-01), Schneider
patent: 2835040 (1958-05-01), D'Elia
patent: 2861346 (1958-11-01), Patterson
patent: 2912764 (1959-11-01), Spurr
patent: 3166850 (1965-01-01), Yamazawa
patent: 3769712 (1973-11-01), Hong
patent: 5287631 (1994-02-01), Stade
patent: 5345692 (1994-09-01), Babitchenko
patent: 5383286 (1995-01-01), Kipnes
patent: 5463818 (1995-11-01), Hughes
patent: 6021580 (2000-02-01), Mangredotti et al.
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