Cleaning process

Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents

Reexamination Certificate

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Details

C134S026000, C134S010000, C134S011000, C134S012000

Reexamination Certificate

active

08080114

ABSTRACT:
Provided is a cleaning process which is simplified and in which a time required for the cleaning process is reduced and which has an excellent cleaning effect. The cleaning process comprises loading a wafer in a high pressure cleaner, injecting high-purity gaseous carbon dioxide (CO2) having low pressure into the high pressure cleaner, injecting CO2having lower pressure than supercritical cleaning pressure into the high pressure cleaner, cleaning the wafer by injecting a supercritical homogeneous transparent phase mixture in which a cleaning additive and supercritical CO2are mixed, into the high pressure cleaner under a supercritical cleaning pressure, rinsing the wafer by injecting a supercritical rinsing mixture in which a rinsing additive and supercritical CO2are mixed, into the high pressure cleaner, and separating CO2from a mixture discharged from the high pressure cleaner.

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patent: 6067728 (2000-05-01), Farmer et al.
patent: 6090450 (2000-07-01), Kahmann et al.
patent: 6732424 (2004-05-01), Nadicksbernd
patent: 6871656 (2005-03-01), Mullee
patent: 6960242 (2005-11-01), Leitch et al.
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patent: 7119052 (2006-10-01), Korzenski et al.
patent: 2002/0170577 (2002-11-01), Mizobata et al.
patent: 2003/0196679 (2003-10-01), Cotte et al.
patent: 2004/0003831 (2004-01-01), Mount
patent: 2004/0224865 (2004-11-01), Roeder et al.

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